Callisto: Entropy-based test generation and data quality assessment for machine learning systems

Published in In the proceedings of the 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 2020

Recommended citation: Sakshi Udeshi, Xingbin Jiang, Sudipta Chattopadhyay, "Callisto: Entropy-based test generation and data quality assessment for machine learning systems." In the proceedings of the 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 2020. https://ieeexplore.ieee.org/abstract/document/9159051/